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Associate Research Professor Yoosuf Picard * Carnegie Mellon

Event Date: 
Monday, October 30, 2017 - 3:30pm to 4:30pm

Prospects for Identifying and Mapping Extended Defects in Bulk Single-Crystals

Backscattered electron detectors in modern scanning electron microscopes (SEMs) offer many contrast mechanisms for compositional or topographic analysis.  Another increasingly prominent imaging method available in SEMs using these detectors is electron channeling contrast imaging (ECCI).  ECCI is comparable to diffraction contrast imaging obtainable by transmission electron microscopy (TEM).  However, SEM-based ECCI is non-destructive and has recently demonstrated unambiguous extended defect identification in a variety of semiconductors.  Our research is further developing ECCI for controlled defect analysis in many semiconductor materials, including SiC, GaN, GaP, SiGe and Ga2O3 through coordinated TEM verification and dynamical electron diffraction simulations.  Prospects for automated, mesoscopic mapping of extended defects will be discussed, as well as the possibility of leveraging material properties and functionality associated with extended defects through controlled defect patterning/engineering in bulk crystals.

Yoosuf Picard is Associate Research Professor in the Department of Materials Science and Engineering at Carnegie Mellon University. His research group develops and applies advanced electron microscopy methods for quantitative microstructural characterization and in situ analysis of nanoscale materials, devices and novel alloys.  Professor Picard obtained a B.S. in Mechanical Engineering from Louisiana Tech University in 2001 and a Ph.D. in Materials Science and Engineering from the University of Michigan—Ann Arbor in 2006. He was a Microsystems Engineering and Science Applications Fellow at Sandia National Laboratories, and later a postdoctoral research associate at the U.S. Naval Research Laboratory (NRL).  He is a recipient of the NRL Alan Berman publication award in 2009 as well as the Birks Award for Best Contributed Paper at the 2010 Microscopy and Microanalysis Conference.  Picard currently serves as Director for the Microanalysis Society (MAS), and was previously the MAS Program Co-Chair for the 2014 Microscopy and Microanalysis conference, as well as a co-organizer for the MAS sponsored 2012, 2014 and 2016 EBSD topical conference series.  Currently, he is the Program Chair for the 2018 Microscopy and Microanalysis meeting and editor of the “Microscopy and Microanalysis” journal.

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