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Professor Setfan Kycia, Physics Department, University of Guelph

Event Date: 
Monday, December 16, 2019 - 3:30pm to 4:30pm

New Opportunities for Materials Science at the Upcoming Brockhouse X-Ray Diffraction and Scattering Sector


The Brockhouse X-ray Diffraction and Scattering Sector at the Canadian Light Source is a large scale national project. It is a direct result of a McMaster workshop held in 2005. The sector should be open for general users in approximately twelve months. It is a collection of endstations designed to conduct a diverse set of diffraction measurements.  I will provide an outline of the sector, present highlights of some of the capabilities.  X-ray diffraction can be much more intricate than simply applying Bragg’s Law which we learn as undergraduates. I will introduce the benefits of using anomalous diffraction, multiple beam methods, grazing incidence diffraction, the dynamical diffraction theory, the high-resolution pair distribution function and x-ray diffraction microscopy. These methods enable scientists to develop a better understanding of epitaxial thin films, polymers, alloys, glasses, nanomaterials and energy materials.


Stefan Kycia is a Professor at of the Physics Department at the University of Guelph. He is also the Team leader of the Brockhouse X-Ray Diffraction and Scattering Sector at the Canadian Light Source. Kycia earned his B.Sc. in Honors Physics from McGill University, Masters Degree in Physics at the University of Pennsylvania and a PhD in Condensed Matter Physics from Iowa State University. Before joining the University of Guelph faculty he was a researcher at Cornell High Energy Synchrotron at Cornell University (CHESS) and the head of the x-ray diffraction group at the LNLS Brazilian Synchrotron


Event Location: 
Location Details: 
ABB 165